Application of Intellectual Systems in Measuring Instruments

Uljayev  Erkin; Sapaev  Mamatkarim; Narzullayev  Shohrukh

doi:10.17605/OSF.IO/KJHZ9

Application of Intellectual Systems in Measuring Instruments

Authors

Uljayev Erkin Professor at Tashkent state technical university
Sapaev Mamatkarim Associate professor at Tashkent University of information technologies
Narzullayev Shohrukh Associate professor at Tashkent state technical university

DOI:

https://doi.org/10.17605/OSF.IO/KJHZ9

Keywords:

artificial intelligence, artificial neural network, training

Abstract

This article focuses on improving the measurement accuracy of measuring instruments by applying artificial neural networks. Algorithms for "training" artificial neural networks, in particular, the basic properties of gradient algorithms and their application are devoted to study.

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Published

2022-12-07

How to Cite

[1]

U. . Erkin, S. . Mamatkarim, and N. . Shohrukh, “Application of Intellectual Systems in Measuring Instruments”, WoS, vol. 1, no. 8, pp. 32–34, Dec. 2022.